Nonparametric multiple comparisons in repeated measures designs for data with ties

Biometrical Journal

Volumn 44, Issue 6, 2002, Pages 762-779

  Munzel, Ullrich ^a   Tamhane, Ajit C ^b  

^a MERZ PHARMACEUTICALS GMBH   (Germany)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Familywise error rate; Joint ranking; Midranks; Ordinal data; Power; Rank statistics; Rank transform tests; Sign statistics

Indexed keywords

BIT ERROR RATE; ERROR STATISTICS; STATISTICAL TESTS;

FAMILYWISE ERROR RATE; JOINT RANKING; MIDRANK; MULTIPLE COMPARISON; ORDINAL DATA; POWER; RANK STATISTICS; RANK TRANSFORM; RANK TRANSFORM TEST; SIGN STATISTICS;

ERROR ANALYSIS;

EID: 0036039889     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4036(200209)44:6<762::AID-BIMJ762>3.0.CO;2-A     Document Type: Article

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