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Volumn , Issue , 2002, Pages 58-68

Empirical interval estimates for the defect content after an inspection

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN ALGEBRA; CURVE FITTING; ESTIMATION; MATRIX ALGEBRA; RANDOM PROCESSES; REGRESSION ANALYSIS; SOFTWARE ENGINEERING;

EID: 0036038640     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/581348.581350     Document Type: Conference Paper
Times cited : (8)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.