Noise properties of a high-speed semiconductor-gas discharge infrared imager

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4669, Issue , 2002, Pages 1-13

  Marchenko, Valery M ^a   Matern, Sascha ^a   Purwins, Hans Georg ^a   Astrov, Yuri A ^a   Portsel, Leonid M ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Gas discharge; High speed infrared imaging; Infrared detector; Noise; Sensitivity; Thermography

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; HEAT RADIATION; INFRARED DETECTORS; PHOTOMULTIPLIERS; PHOTONS; SENSITIVITY ANALYSIS; SILICON WAFERS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; THERMOGRAPHY (IMAGING); ULTRAFAST PHENOMENA;

SEMICONDUCTOR-GAS DISCHARGE (SGD) CELLS;

IMAGE SENSORS;

EID: 0036031484     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.463412     Document Type: Conference Paper

References (11)

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