Modeling of scattering by a rough surface of layered media

International Geoscience and Remote Sensing Symposium (IGARSS)

Volumn 2, Issue , 2002, Pages 1251-1253

  Fuks, Iosif M ^a  

^a NOAA EARTH SYSTEM RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; PERMITTIVITY; PERTURBATION TECHNIQUES; REFRACTIVE INDEX; SURFACE ROUGHNESS; VECTORS;

FRESNEL REFLECTION COEFFICIENT; SPECULAR REFLECTION COEFFICIENT;

ELECTROMAGNETIC WAVE SCATTERING;

EID: 0036031446     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. I.M. Fuks, "Wave diffraction by a rough boundary of an arbitrary plane-layered media," IEEE Transactions on Antennas and Propagation, vol.49, No. 4, pp. 630-639, 2001.
2. I.M. Fuks and A.G. Voronovich, "Wave diffraction by rough interfaces in an arbitrary plane-layered medium," Waves Random Media, vol. 10, No.2, pp. 253-272, 2000.
3. Yu.S. Kaganovskii, V.D. Freilikher, E. Kanzieper, Y. Nafcha, M. Rosenbluh and I.M. Fuks, "Light scattering from slightly rough dielectric films," J. Opt. Soc. Am. A, vol.16, No.2, p.331-338, 1999.