Constitutive and finite element modeling of ferroelectric repolarization

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4699, Issue , 2002, Pages 21-30

  Kessler, Hannes ^a   Kamlah, Marc ^b   Balke, Herbert ^a  

^a INSTITUTE OF SOLID MECHANICS   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Constitutive law; Elliptic cavity; Ferroelectric material; Finite element method

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; ELECTROMECHANICAL DEVICES; FINITE ELEMENT METHOD; PIEZOELECTRICITY; PLASTICITY; POLARIZATION; REMANENCE; STRESS CONCENTRATION; SWITCHING; YIELD STRESS;

FERROELECTRIC REPOLARIZATIONS;

FERROELECTRIC MATERIALS;

EID: 0036031428     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.475003     Document Type: Article

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