Using an image retrieval system for image data management

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4692, Issue , 2002, Pages 120-127

  Karnowski, T P ^a   Tobin, K W ^a   Ferrell, R K ^a   Jatko, W B ^a   Lakhani, F ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Content based image retrieval; Data management; Defect detection

Indexed keywords

AUTOMATIC INDEXING; CRYSTAL DEFECTS; DECISION THEORY; IMAGE ANALYSIS; IMAGE RETRIEVAL; INFORMATION MANAGEMENT; ONLINE SYSTEMS; QUERY LANGUAGES; SEMICONDUCTOR DEVICE MANUFACTURE; TREES (MATHEMATICS);

AUTOMATED IMAGE RETRIEVAL (AIR) SYSTEMS; SEMICONDUCTOR DEFECTS;

IMAGING SYSTEMS;

EID: 0036030918     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.475648     Document Type: Conference Paper

References (4)

1. Tobin, K.W., Karnowski, T.P., Lakhani, F., "The Use of Historical Defect Imagery for Yield Learning", The 11th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Fairmont Copley Plaza Hotel, Boston, MA, September 12-14, 2000.
2. th International Symposium on Electronic Imaging: Science and Technology, San Jose Convention Center, January 2000.
3. th International Symposium on Electronic Imaging: Science and Technology, San Jose Convention Center, January 2001.
4. S. Arya, D.M. Mount, N.S. Netanyahu, R. Silverman, and A.Y. Wu, "An Optimal Algorithm for Approximate Nearest Neighbor Searching in Fixed Dimensions", Proc. of the Fifth Annual ACM-SIAM Symposium on Discrete Algorithms, 1994, pp. 573-582.