Built-in damage detection system for sandwich structures under cryogenic temperatures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4701, Issue , 2002, Pages 97-107

  Blaise, Eric ^a   Chang, Fu Kuo ^a  

^a 496 Lomita Mall   (United States)

Author keywords

Cryogenic temperatures; Damage detection; Debond; Embedded sensor; PZT; Sandwich structure

Indexed keywords

COMPRESSIVE STRENGTH; CRYOGENICS; SENSORS; SIGNAL PROCESSING; SOFTWARE ENGINEERING;

EMBEDDED SENSORS;

SANDWICH STRUCTURES;

EID: 0036030473     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.474650     Document Type: Conference Paper

References (7)

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