|
Volumn 4690 I, Issue , 2002, Pages 351-356
|
High numerical aperture-imaging implications for chemically amplified photoresists
|
Author keywords
Aerial image; Brewster s angle; High numerical aperture; Interferometric lithography; Polarization
|
Indexed keywords
ANTIREFLECTION COATINGS;
IMAGING TECHNIQUES;
LIGHT ABSORPTION;
LIGHT POLARIZATION;
SCANNING ELECTRON MICROSCOPY;
HIGH NUMERICAL APERTURE;
PHOTORESISTS;
|
EID: 0036028781
PISSN: 0277786X
EISSN: None
Source Type: Journal
DOI: 10.1117/12.474233 Document Type: Article |
Times cited : (6)
|
References (12)
|