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Volumn 4690 I, Issue , 2002, Pages 351-356

High numerical aperture-imaging implications for chemically amplified photoresists

Author keywords

Aerial image; Brewster s angle; High numerical aperture; Interferometric lithography; Polarization

Indexed keywords

ANTIREFLECTION COATINGS; IMAGING TECHNIQUES; LIGHT ABSORPTION; LIGHT POLARIZATION; SCANNING ELECTRON MICROSCOPY;

EID: 0036028781     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.474233     Document Type: Article
Times cited : (6)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.