A process capability index that is based on the proportion of conformance

Journal of Statistical Computation and Simulation

Volumn 72, Issue 9, 2002, Pages 707-718

  Perakis, Michael ^a   Xekalaki, Evdokia ^a  

^a ATHENS UNIVERSITY OF ECONOMICS AND BUSINESS   (Greece)

Author keywords

Confidence limits; Exponential distribution; Normal distribution; Process capability indices; Proportion of conformance

Indexed keywords

EID: 0036026577     PISSN: 00949655     EISSN: None     Source Type: Journal    
DOI: 10.1080/00949650214270     Document Type: Article

References (18)

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