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Volumn 8, Issue 3, 2002, Pages 216-226

Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS

(3) Verlinden, Geert a Gijbels, Renaat a Geuens, Ingrid a

a UNIVERSITY OF ANTWERP (Belgium)

Author keywords

Dual beam depth profiling; Imaging; Particle analysis; Silver halide microcrystals; Surface analysis; TOF SIMS

Indexed keywords

BROMIDES; CRYSTALLIZATION; CRYSTALLOGRAPHY; DRUG DELIVERY SYSTEMS; IODIDES; MODELS, STRUCTURAL; OSMOLAR CONCENTRATION; SILVER COMPOUNDS; SPECTROMETRY, MASS, SECONDARY ION; SURFACE PROPERTIES; THIOCYANATES;

BROMIDE; IODIDE; SILVER BROMIDE; SILVER DERIVATIVE; THIOCYANATE; THIOCYANIC ACID DERIVATIVE;

ARTICLE; AUDIOVISUAL EQUIPMENT; CHEMISTRY; CRYSTALLIZATION; CRYSTALLOGRAPHY; DRUG DELIVERY SYSTEM; MASS SPECTROMETRY; METHODOLOGY; OSMOLARITY; SURFACE PROPERTY;

EID: 0036018945 PISSN: 14319276 EISSN: None Source Type: Journal
DOI: 10.1017/S1431927602020159 Document Type: Article

Times cited : (2)

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