A study of small-angle X-ray scattering from solutions of fullerence C60 in o-xylene

Russian Journal of Physical Chemistry A

Volumn 76, Issue 3, 2002, Pages 482-484

  Golubkov, V V ^a   Shakhmatkin, B A ^a   Charykov, N A ^a   Aksel'rod, B M ^a  

^a GREBENSHCHIKOV INSTITUTE OF SILICATE CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

FULLERENE; XYLENE;

AQUEOUS SOLUTION; ARTICLE; COMPLEX FORMATION; CONCENTRATION RESPONSE; RADIATION SCATTERING; X RAY CRYSTALLOGRAPHY;

EID: 0036012604     PISSN: 00360244     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. Golubkov, V.V., Shakhmatkin, B.A., Charykov, N.A., and Aksel'rod, B.M., Zh. Fiz. Khim., 2001, vol. 75, no. 2, p. 1819.
2. Belousov, V.P., Belousova, I.M., Danilov, O.B., et al., Opt. Spektrosk., 1997, vol. 64, p. 37.
3. Ponomarev, A.N., Aksel'rod, B.M., Barchenko, V.T., et al., Zh. Fiz. Khim., 2000, vol. 74, p. 2031.