Equivalent linear logistic test models

Psychometrika

Volumn 67, Issue 1, 2002, Pages 123-136

  Bechger, Timo M ^a   Verstralen, Huub H F M ^a   Verhelst, Norman D ^a  

^a Cito group   (Netherlands)

Author keywords

Item response theory (IRT); Lagrange multiplier test; Linear logistic test model

Indexed keywords

EID: 0036011446     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02294712     Document Type: Article

References (30)

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