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Volumn 58, Issue 3, 2002, Pages 487-493
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Pattern-recognition methods to identify secondary structure within X-ray crystallographic electron-density maps
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Author keywords
[No Author keywords available]
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Indexed keywords
PROTEIN;
ALGORITHM;
ARTICLE;
AUTOMATED PATTERN RECOGNITION;
CHEMICAL MODEL;
CHEMICAL STRUCTURE;
CHEMISTRY;
METHODOLOGY;
PROTEIN CONFORMATION;
PROTEIN SECONDARY STRUCTURE;
X RAY CRYSTALLOGRAPHY;
ALGORITHMS;
CRYSTALLOGRAPHY, X-RAY;
MODELS, CHEMICAL;
MODELS, MOLECULAR;
PATTERN RECOGNITION, AUTOMATED;
PROTEIN CONFORMATION;
PROTEIN STRUCTURE, SECONDARY;
PROTEINS;
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EID: 0036006267
PISSN: 09074449
EISSN: None
Source Type: Journal
DOI: 10.1107/S0907444902000525 Document Type: Article |
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Times cited : (27)
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References (15)
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