Atomic force microscopy study of epitaxial Bi4Ti3O12 thin films formed using a dipping-pyrolysis process

Journal of the Korean Physical Society

Volumn 40, Issue 3, 2002, Pages 493-496

  Ryu, Hyun Wook ^a   Hwang, Kyu Seog ^b  

^a Chonnam National University   (South Korea)

^b Nambu University   (South Korea)

Author keywords

AFM; Bi4Ti3O12 thin film; Dipping pyrolysis process; PSD function; Surface morphology

Indexed keywords

EID: 0036004535     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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