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Volumn 34, Issue 2, 2002, Pages 127-134
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A new apparatus for thermal diffusivity and specific heat measurements of films and liquids by means of Fourier transform thermal analysis
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Sinku Riko Inc
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
THERMAL DIFFUSIVITY;
ELECTRIC INSULATION;
FOURIER TRANSFORMS;
POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);
RESISTORS;
SPECIFIC HEAT;
THERMAL CONDUCTIVITY;
THERMAL DIFFUSION;
THIN FILMS;
THERMOANALYSIS;
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EID: 0036004451
PISSN: 00181544
EISSN: None
Source Type: Journal
DOI: 10.1068/htwu457 Document Type: Article |
Times cited : (11)
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References (19)
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