SCOPUS 정보 검색 플랫폼

Chinese Physics Letters

Volumn 19, Issue 5, 2002, Pages 677-679

A Z-scan study of LiNbO3 thin films

(7) Wang, Qu Quan a,b,c Shi, Jing c Yang, Bai Feng c Liu, Hai Lin c Xiong, Gui Guang c Gong, Qi Huang b Xue, Qi Kun a

a INSTITUTE OF PHYSICS (China)

b PEKING UNIVERSITY (China)

c WUHAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

LITHIUM COMPOUNDS; NONLINEAR OPTICS; REFRACTIVE INDEX; SILICA; THIN FILMS;

NONLINEAR ABSORPTION COEFFICIENT; NONLINEAR REFRACTIVE INDEX; PICOSECOND LASER PULSE; R.F. SPUTTERING; RF-SPUTTERING; SPUTTERING TECHNIQUES; THIN-FILMS; THIRD-ORDER OPTICAL NONLINEARITIES; Z-SCAN METHOD; Z-SCAN STUDY;

NIOBIUM COMPOUNDS;

EID: 0036000709 PISSN: 0256307X EISSN: None Source Type: Journal
DOI: 10.1088/0256-307X/19/5/321 Document Type: Article

Times cited : (12)

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