Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films

Chinese Chemical Letters

Volumn 13, Issue 5, 2002, Pages 484-486

  Lin, Yuan ^a   Jiang, Feng Zhi ^a   Zhang, Jing Bo ^a   Song, Yan Lin ^a   Jiang, Lei ^a   Xiao, Xu Rui ^a  

^a INSTITUTE OF CHEMISTRY   (China)

Author keywords

AFM topography; Chemical treatments; Local conductivity; Nanocrystalline TiO2 films

Indexed keywords

TITANIUM DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; DIFFRACTION; FILM; QUANTITATIVE ANALYSIS; SURFACE PROPERTY;

EID: 0036000643     PISSN: 10018417     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (1)

1. D.S. Zhang, Y. Liu, W.B. Wang, X.R. Xiao, Chin. Sci. Bull., 2000, 45,1956.