High resolution transmission electron microscope analysis of CdSe/ZnSe strained layer snperlattices grown on InP

Physica Status Solidi (B) Basic Research

Volumn 229, Issue 1, 2002, Pages 209-212

  Nabetani, Y ^a   Kobayashi, Y ^a   Kato, T ^a   Matsumoto, T ^a  

^a UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035994373     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200201)229:1<209::AID-PSSB209>3.0.CO;2-S     Document Type: Conference Paper

References (8)