SCOPUS 정보 검색 플랫폼

Physica Status Solidi (B) Basic Research

Volumn 229, Issue 3, 2002, Pages 1175-1186

Structural investigation of copper phthalocyanine thin films using X-ray diffraction, Raman scattering and optical absorption measurements

(4) Prabakaran, R a Kesavamoorthy, R b Reddy, G L N b Xavier, F P a

a LOYOLA COLLEGE (India)

b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035994302 PISSN: 03701972 EISSN: None Source Type: Journal
DOI: 10.1002/1521-3951(200202)229:3<1175::AID-PSSB1175>3.0.CO;2-K Document Type: Article

Times cited : (105)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.