Atomic resolution imaging of a single-crystal Cu (100) surface by scanning tunneling microscopy in ultrahigh vacuum at room temperature

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 4, 2002, Pages 1567-1569

  Zou, Z Q ^a,b   Dong, Z C ^a   Trifonov, A S ^a   Nejo, H ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE STRUCTURE; THERMAL EFFECTS; VACUUM APPLICATIONS;

ATOMIC RESOLUTION IMAGING; ATOMIC SPACING; ATOMICALLY ORDERED ARRAY; AVERAGE CORRUGATION AMPLITUDE; INTERATOMIC DISTANCE;

COPPER;

EID: 0035982589     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1495903     Document Type: Conference Paper

References (12)