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Volumn 313, Issue 1-2, 2001, Pages 53-63

Understanding the creep behavior of a 2.5 D Cf-SiC composite. III. From mesoscale to nanoscale microstructural and morphological investigation towards creep mechanism

(3) Boitier, G a Vicens, J a Chermant, J L a

a CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; CREEP; CRYSTAL MICROSTRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; MICROCRACKS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

MATRIX MICROCRACKING;

COMPOSITE MATERIALS;

CARBON FIBER; CREEP; MICROSTRUCTURE; MORPHOLOGY; SILICON CARBIDE;

EID: 0035979909 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5093(01)01137-6 Document Type: Article

Times cited : (19)

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