Ion trajectory simulation of inductively coupled plasma mass spectrometry based on plasma-interface behavior

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 7, 2001, Pages 1249-1261

  Sakata, Ken’ichi ^a   Yamada, Noriyuki ^a   Sugiyama, Naoki ^a  

^a YOKOGAWA ANALYTICAL SYSTEMS INC   (Japan)

Author keywords

ICP MS; Interface model; Ion trajectory; Plasma boundary; Simulation

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELDS; INDUCTIVELY COUPLED PLASMA; ION BEAMS; MATHEMATICAL MODELS; PARTICLE BEAM DYNAMICS; PLASMA DIAGNOSTICS;

ION TRAJECTORY SIMULATION;

MASS SPECTROMETRY;

EID: 0035979161     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00222-1     Document Type: Article

References (18)

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