Influence of current annealing, stress, torsion and dc magnetic field on matteucci effect in amorphous wires

Materials Science and Engineering: A

Volumn 304-306, Issue 1-2, 2001, Pages 1055-1057

  Kane, S N ^a   Vazquez M ^b   Hernando, A ^b   Gupta, A ^c  

^a DEVI AHILYA UNIVERSITY   (India)

^b INSTITUTO DE MAGNETISMO APLICADO   (Spain)

^c UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Amorphous wires; Current annealing; Matteucci effect; Soft magnetic materials

Indexed keywords

ANISOTROPY; ANNEALING; ELECTRIC POTENTIAL; MAGNETIC FIELDS; TORSIONAL STRESS;

AMORPHOUS WIRES;

AMORPHOUS MATERIALS;

MICROSTRUCTURE; PHYSICAL PROPERTY;

EID: 0035978789     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01754-8     Document Type: Article

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