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Volumn 56, Issue 11, 2001, Pages 2253-2260
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Characterization of trace elements in high viscosity materials by total reflection X-ray spectrometry
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Author keywords
Estimation content of C plus O in polymers; Polymer samples; Scattering radiation method; Trace element analysis; TXRF
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Indexed keywords
FLUORESCENCE;
GELS;
POLYMERS;
TRACE ANALYSIS;
TRACE ELEMENTS;
X RAY ANALYSIS;
RADIATION SCATTERING;
TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF);
SPECTROMETRY;
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EID: 0035976270
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/S0584-8547(01)00327-5 Document Type: Article |
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Times cited : (6)
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References (21)
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