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Volumn 42, Issue 13, 2001, Pages 5625-5632
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Resonance Raman spectroscopic investigation of the mechanism and kinetics of the degradation of N, N-hexamethylene bishexamide, a Nylon 6, 6 model compound
a,c
a,c
a
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Author keywords
Degradation; Kinetics; Nylon
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Indexed keywords
CHEMICAL BONDS;
LASER PULSES;
PHOTODEGRADATION;
PHOTOOXIDATION;
POLYAMIDES;
RAMAN SPECTROSCOPY;
RATE CONSTANTS;
RESONANCE;
ENAL DEGRADATION;
NYLON POLYMERS;
AMIDE;
CYCLOHEXANE DERIVATIVE;
N,N HEXAMETHYLENE BISHEXAMIDE;
UNCLASSIFIED DRUG;
ARTICLE;
IRRADIATION;
LASER;
MOLECULAR DYNAMICS;
PHOTODEGRADATION;
PHOTOOXIDATION;
RAMAN SPECTROMETRY;
TIME;
VIBRATION;
DEGRADATION;
IRRADIATION;
KINETICS;
NYLON 66;
RAMAN SPECTROSCOPY;
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EID: 0035970571
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(01)00004-0 Document Type: Article |
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Times cited : (3)
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References (12)
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