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Volumn 45, Issue 8, 2001, Pages 931-937
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Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue
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Author keywords
Fatigue; Intermetallic; Shear bands; TiAl alloy; Transmission electron microscopy
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Indexed keywords
CRACKS;
DISLOCATIONS (CRYSTALS);
FATIGUE OF MATERIALS;
INTERMETALLICS;
MICROCRACKING;
SCANNING ELECTRON MICROSCOPY;
SHEAR STRESS;
TRANSMISSION ELECTRON MICROSCOPY;
TWINNING;
LAMELLAR ALLOYS;
MICROSLIP BANDS;
TITANIUM ALLOYS;
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EID: 0035968952
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(01)01114-9 Document Type: Article |
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Times cited : (17)
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References (7)
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