Effect of sulfurization on the microstructure of chalcopyrite thin-film absorbers

Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 80-82

  Keranen J ^a   Lu, J ^a   Barnard, J ^a   Sterner, J ^a   Kessler, J ^a   Stolt, L ^a   Matthes, Th W ^b   Olsson, E ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

CIGS; CIS; Sulfurization; TEM; Transmission electron microscopy

Indexed keywords

COPPER ALLOYS; EVAPORATION; FILM GROWTH; GLASS; MICROSTRUCTURE; PHASE SEPARATION; POLYCRYSTALLINE MATERIALS; RAPID THERMAL ANNEALING; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CHALCOPYRITE; COEVAPORATION; COPPER INDIUM GALLIUM SELENIDE; COPPER INDIUM SELENIDE; SULFURIZATION;

SEMICONDUCTING FILMS;

EID: 0035967584     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)00789-1     Document Type: Article

References (5)