Investigation of CdTe solar cells via capacitance and impedance measurements

Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 239-242

  Friesen, G ^b   Dunlop, E D ^a   Wendt, R ^c  

^a JOINT RESEARCH CENTRE   (Italy)

^b UNIVERSITY OF KONSTANZ   (Germany)

^c ANTEC GmbH   (Germany)

Author keywords

CdTe; CV measurements; Equivalent circuit; Etching; Impedance spectroscopy; Roll over

Indexed keywords

CAPACITANCE MEASUREMENT; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC IMPEDANCE MEASUREMENT; EQUIVALENT CIRCUITS; ETCHING; INTERFACES (MATERIALS); OPTICAL CORRELATION; SEMICONDUCTING CADMIUM COMPOUNDS;

IMPEDANCE SPECTROSCOPY; NITRIC-PHOSPHORIC ETCHING PROCESS;

SOLAR CELLS;

EID: 0035967572     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01832-0     Document Type: Article

References (2)