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Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 60-62

Effect of sodium on Bridgman-grown Cu(In1-xGax)3Se5 crystalline materials

(3) Wang, H P a Shih, I a Champness, C H a

a MCGILL UNIVERSITY (Canada)

Author keywords

Bridgman method; Cu(In1 xGax)3 Se5; Monocrystalline; Sodium effect

Indexed keywords

CARRIER CONCENTRATION; COPPER ALLOYS; CRYSTAL GROWTH; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTROMAGNETIC WAVE REFLECTION; HALL EFFECT; INGOTS; MICROANALYSIS; POINT DEFECTS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DOPING; SINGLE CRYSTALS; SODIUM; THIN FILMS;

COPPER INDIUM GALLIUM SELENIDE; ELECTRON PROBE MICROANALYSIS (EPMA); HORIZONTAL BRIDGMAN METHOD; VACANCIES; X RAY LAUE BACKREFLECTION;

SEMICONDUCTING FILMS;

EID: 0035967560 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(00)01840-X Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.