-
1
-
-
0032576518
-
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3893
-
-
Ren, F.1
Hong, M.2
Chu, S.N.G.3
Marcus, M.A.4
Schurman, M.J.5
Baca, A.G.6
Pearton, S.J.7
Abernathy, C.R.8
-
2
-
-
0001257727
-
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3230
-
-
Johnson, J.W.1
Luo, B.2
Ren, F.3
Gila, B.P.4
Krishnamoorthy, V.5
Abernathy, C.R.6
Pearton, S.J.7
Chyi, J.I.8
Nee, T.E.9
Lee, C.M.10
Chu, C.C.11
-
4
-
-
0032295452
-
-
(1998)
Solid State Electron.
, vol.42
, pp. 2177
-
-
Ren, F.1
Abernathy, C.R.2
MacKenzie, J.D.3
Gila, B.P.4
Pearton, S.J.5
Hong, M.6
Marcus, M.A.7
Schurman, M.J.8
Baca, A.G.9
Shul, R.J.10
-
6
-
-
18044401608
-
-
Toronto, Canada, May
-
(2000)
197th Electro-chemical Society Meeting
-
-
Hong, M.1
Ng, H.M.2
Kwo, J.3
Kortan, A.R.4
Baillargeon, J.N.5
Chu, S.N.G.6
Mannaerts, J.P.7
Cho, A.Y.8
Ren, F.9
Abernathy, C.R.10
Pearton, S.J.11
-
12
-
-
0034141006
-
-
(2000)
IEEE Electron. Dev. Lett.
, vol.21
, Issue.2
, pp. 63
-
-
Asif Khan, M.1
Hu, X.2
Sumin, G.3
Lunev, A.4
Jang, J.5
Gaska, R.6
Shur, M.S.7
-
13
-
-
0012426898
-
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 2297
-
-
Hong, M.1
Passlack, M.2
Mannaerts, J.P.3
Kwo, J.4
Chu, S.N.G.5
Moriya, N.6
Hou, S.Y.7
Fratello, V.J.8
-
14
-
-
0031075990
-
-
(1997)
IEEE Trans. Electron. Dev.
, vol.44
, pp. 214
-
-
Passlack, M.1
Hong, M.2
Mannaerts, J.P.3
Kwo, J.4
Opila, R.L.5
Chu, S.N.G.6
Moriya, N.7
Ren, F.8
-
18
-
-
0032651807
-
-
(1999)
Mater. Res. Soc. Symp. Proc.
, vol.573
, pp. 161
-
-
Shul, R.J.1
Zhang, L.2
Baca, A.G.3
Willison, C.G.4
Han, J.5
Pearton, S.J.6
Ren, F.7
Zolper, J.C.8
Lester, L.F.9
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