Effect of composition on the electrical and structural properties of As-Te-Ga thin films

Applied Surface Science

Volumn 185, Issue 1-2, 2001, Pages 1-10

  Dongol, M ^a   Hafiz, M M ^b   Abou Zied, M ^a   Elhady, A F ^a  

^a SOUTH VALLEY UNIVERSITY   (Egypt)

^b UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

Chalcogenide; Electrical conduction; Semiconductors; Thin films; Transmission electron microscopy (TEM)

Indexed keywords

ACTIVATION ENERGY; COMPOSITION EFFECTS; CRYSTAL ATOMIC STRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY MEASUREMENT; MATHEMATICAL MODELS; PHASE TRANSITIONS; RAPID THERMAL ANNEALING; SEMICONDUCTING GALLIUM COMPOUNDS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CHALCOGENIDE THIN FILMS; VALENCE ALTERNATION PAIR (VAP) MODEL;

THIN FILMS;

EID: 0035965963     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00394-4     Document Type: Article

References (17)