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Volumn 45, Issue 6, 2001, Pages 733-738
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Orientation effects during grain subdivision and subsequent annealing in coarse-grained tantalum
a
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Author keywords
Cold working; EBSD; Microstructure; Recrystallization recovery; Tantalum
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Indexed keywords
ANNEALING;
BACKSCATTERING;
COLD ROLLING;
CRYSTALLIZATION;
DISLOCATIONS (CRYSTALS);
ELECTRON DIFFRACTION;
GRAIN BOUNDARIES;
GRAIN GROWTH;
INGOTS;
METALLOGRAPHIC MICROSTRUCTURE;
MICROHARDNESS;
SCANNING ELECTRON MICROSCOPY;
VICKERS HARDNESS TESTING;
ELECTRON BACKSCATTERING DIFFRACTION (EBSD);
TANTALUM;
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EID: 0035965070
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(01)01087-9 Document Type: Article |
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Times cited : (41)
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References (16)
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