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Volumn 322, Issue 1-2, 2001, Pages 127-134
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Structural disorder and magnetism of the semiconducting clathrate Eu8Ga16Ge30
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Author keywords
Atomic displacement parameters; Ba8 Ga16Ge30; Eu8Ga16Ge30; Ferromagnet; Neutron diffraction; Semiconductor clathrate
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Indexed keywords
EUROPIUM COMPOUNDS;
FERROMAGNETISM;
NEUTRON DIFFRACTION;
SATURATION (MATERIALS COMPOSITION);
SEMICONDUCTOR DEVICE MODELS;
ATOMIC DISPLACEMENT PARAMETERS;
SEMICONDUCTOR CLATHRATES;
MAGNETIC SEMICONDUCTORS;
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EID: 0035963562
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(01)01169-0 Document Type: Article |
Times cited : (117)
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References (24)
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