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Volumn 322, Issue 1-2, 2001, Pages 127-134

Structural disorder and magnetism of the semiconducting clathrate Eu8Ga16Ge30

Author keywords

Atomic displacement parameters; Ba8 Ga16Ge30; Eu8Ga16Ge30; Ferromagnet; Neutron diffraction; Semiconductor clathrate

Indexed keywords

EUROPIUM COMPOUNDS; FERROMAGNETISM; NEUTRON DIFFRACTION; SATURATION (MATERIALS COMPOSITION); SEMICONDUCTOR DEVICE MODELS;

EID: 0035963562     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(01)01169-0     Document Type: Article
Times cited : (117)

References (24)
  • 11
    • 0000098939 scopus 로고    scopus 로고
    • T.M. Tritt, M.G. Kanatzidis, G. Mahan, H.B. Lyon Jr. (Eds.), Thermoelectric Materials 1998 - The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications, Materials Research Society, Pittsburgh, PA
    • (1998) Materials Research Society Symposium Proceedings , vol.545 , pp. 435
    • Nolas, G.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.