Effect of annealing temperature on the sensitivity of tin dioxide films prepared via a sulphide route

Journal of Materials Science Letters

Volumn 20, Issue 5, 2001, Pages 435-437

  Banerjee, A ^a   Chattopadhyay, D ^a   Mukherjee, R ^a   Halder, A K ^a   Mondal, J ^a   Sen, A ^a   Maiti, H S ^a  

^a CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURING; DISSOLUTION; ELECTRIC CONDUCTIVITY MEASUREMENT; PRECIPITATION (CHEMICAL); THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

GAS SENSITIVITY MEASUREMENT; SODIUM SULPHIDE; TIN DIOXIDE;

TIN COMPOUNDS;

EID: 0035961142     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010902531009     Document Type: Article

References (27)