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Volumn 154, Issue 13, 2001, Pages 60-
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Testing key to scramjet success
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035952758
PISSN: 00052175
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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