Surface-monolayer-controlled molecular alignment of short n-alkane multilayers

Langmuir

Volumn 17, Issue 26, 2001, Pages 8178-8183

  Kondoh, H ^a   Matsui, F ^a,b   Ehara, Y ^a   Yokoyama, T ^a   Ohta, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY ABSORPTION;

FREE ENERGY; INTERFACES (MATERIALS); MOLECULAR ORIENTATION; MONOLAYERS; X RAY ANALYSIS;

MULTILAYERS;

EID: 0035951213     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la010783h     Document Type: Article

References (46)

1. Geary, J.M.; Goodby, J.W.; Kmetz, A.R.; Patel, J.S. J. Appl. Phys. 1987, 62, 4100.
2. Hirosawa, I. Jpn. J. Appl. Phys. 1996, 35, 5873.
3. Hasegawa, R.; Mori, Y.; Sasaki, H.; Ishibashi, M. Jpn. J. Appl. Phys. 1996, 35, 2492.
4. Sakamoto, K.; Arafune, R.; Ito, N.; Ushioda, S.; Suzuki, Y.; Morokawa, S. Jpn. J. Appl. Phys. 1994, 33, L1323; J. Appl. Phys. 1996, 80, 431.
5. Sakamoto, K.; Arafune, R.; Ito, N.; Ushioda, S.; Suzuki, Y.; Morokawa, S. Jpn. J. Appl. Phys. 1994, 33, L1323; J. Appl. Phys. 1996, 80, 431.
6. Pidduck, A.J. et al. J. Vac. Sci. Technol. A 1996, 14, 1723; Kim, Y.B. et al. Appl. Phys. Lett. 1995, 66, 2218; Zhu, Y.M. et al. Appl. Phys. Lett. 1994, 65, 49.
7. Pidduck, A.J. et al. J. Vac. Sci. Technol. A 1996, 14, 1723; Kim, Y.B. et al. Appl. Phys. Lett. 1995, 66, 2218; Zhu, Y.M. et al. Appl. Phys. Lett. 1994, 65, 49.
8. Pidduck, A.J. et al. J. Vac. Sci. Technol. A 1996, 14, 1723; Kim, Y.B. et al. Appl. Phys. Lett. 1995, 66, 2218; Zhu, Y.M. et al. Appl. Phys. Lett. 1994, 65, 49.
9. Weiss, K.; Wöll, Ch.; Böhm, E.; Fiebranz, G.; Forstmann, G.; Peng, B.; Scheumann, V.; Johannsmann, D. Macromolecules 1998, 32, 1930; Stöhr, J.; Samant, M.G.; Cossy-Favre, A.; Díaz, J.; Momoi, Y.; Odahara, S.; Nagata, T. Macromolecules 1998, 31, 1942.
10. Weiss, K.; Wöll, Ch.; Böhm, E.; Fiebranz, G.; Forstmann, G.; Peng, B.; Scheumann, V.; Johannsmann, D. Macromolecules 1998, 32, 1930; Stöhr, J.; Samant, M.G.; Cossy-Favre, A.; Díaz, J.; Momoi, Y.; Odahara, S.; Nagata, T. Macromolecules 1998, 31, 1942.
11. Ouchi, Y.; Mori, I.; Sei, M.; Ito, E.; Araki, T.; Ishii, H.; Seki, K.; Kondo, K. Physica 1995, B208/209, 407.
12. Zhuang, X.; Marrucci, L.; Shen, Y.R. Phys. Rev. Lett. 1994, 73, 1513.
13. Wei, X.; Zhuang, X.; Hong, S.-C.; Goto, T.; Shen, Y.R. Phys. Rev. Lett. 1999, 82, 4256.
14. Poirier, G. Chem. Rev. 1997, 97, 1117.
15. Schreiber, F.; Eberhardt, A.; Leung, T.Y.; Schwartz, P.; Wetterer, S.M.; Lavrich, D.J.; Berman, L.; Fenter, P.; Eisenberger, P.; Scoles, G. Phys. Rev. B 1998, 57, 12476.
16. Kondoh, H.; Kodama, C.; Sumida, H.; Nozoye, H. J. Chem. Phys. 1999, 111, 1175.
17. Kondoh, H.; Saito, N. Matsui, F.; Yokoyama, T.; Kuroda, H.; Ohta, T. J. Phys. Chem. B, in press.
18. Namba, H.; Daimon, H.; Idei, Y.; Kosugi, N.; Kuroda, H.; Taniguchi, M.; Suga, S.; Murata, Y.; Ueyama, K.; Miyahara, T. Rev. Sci. Instr. 1989, 60, 1909.
19. Stöhr, J.; Outka, D.A.; Baberschke, K.; Arvanitis, D.; Horsley, J.A. Phys. Rev. B 1987, 36, 2976.
20. Outka, D.A.; Stöhr, J.; Rabe, J.P.; Swalen, J.D. J. Chem. Phys. 1988, 88, 4076.
21. Ohta, T.; Seki, K.; Yokoyama, T.; Morisada, I.; Edamatsu, K. Phys. Scr. 1990, 41, 150.
22. Hahner, G.; Kinzler, M.; Thummler, C.; Wöll, Ch.; Grunze, M. J. Vac. Sci. Technol. A 1992, 10, 2758.
23. Stöhr, J. NEXAFS Spectroscopy; Springer-Verlag Publishing: New York, 1992.
24. Bagus, P.S.; Weiss, K.; Schertel, A.; Wöll, Ch.; Bruun, W.; Hellwig, C.; Jung, C. Chem. Phys. Lett. 1996, 248, 129.
25. Väterlein, P.; Fink, R.; Umbach, E.; Wurth, W. J. Chem. Phys. 1998, 108, 3313.
26. Hitchcock, A.P.; Ishii, I. J. Electron Spectrosc. Relat. Phenom. 1987, 42, 11.
27. Weiss, K.; Weckesser, J.; Wöll, Ch. J. Mol. Struct. (THEOCHEM) 1999, 458, 143. They also observed a shoulder at 285.1 eV, which may come from the interaction with metal substrates. In our study, however, certain evidence of the peak was not obtained. We were especially careful around the energy region, because the energy is close to that of π* resonance from contaminated hydrocarbons.
28. Uosaki, K.; Yamada, R. J. Am. Chem. Soc. 1999, 121, 4090.
29. Xie, Z.X.; Xu, X.; Tang, J.; Mae, B.W. J. Phys. Chem. B 2000, 104, 11719.
30. Yamamoto, M.; Sakurai, Y.; Hosoi, Y.; Ishii, H.; Kajikawa, K.; Ouchi, Y.; Seki, K. J. Phys. Chem. 2000, 104.
31. Firment, L.E.; Somorjai, G.A. J. Chem. Phys. 1977, 66, 2901.
32. Firment, L.E.; Somorjai, G.A. J. Chem. Phys. 1978, 69, 3940.
33. Weckesser, J.; Fuhrmann, D.; Weiss, K.; Wöll, Ch.; Richardson, N.V. Surf. Rev. Lett. 1997, 2, 209.
34. Yoshimura, D.; Ishii, H.; Ouchi, Y.; Ito, E.; Miyamae, T.; Hasegawa, S.; Okudaira, K.K.; Ueno, N.; Seki, K. Phys. Rev. B 1999, 60, 9046.
35. Yamamoto, M.; Sakurai, Y.; Hosoi, Y.; Ishii, H.; Kajikawa, K.; Ouchi, Y.; Seki, K. J. Phys. Chem. 2000, 104, 7370.
36. In the monolayer adsorbates, another continuum state appears above the Fermi level which is usually located below the ionization threshold of the adsorbates (see ref 19). Therefore, another error function with a lower-energy position (287.8 eV) was introduced into this curve-fitting analysis.
37. Fenter, P.; Eberhardt, A.; Liang, K.S.; Eisenberger, P. J. Chem. Phys. 1997, 106, 1600.
38. Kondoh, H.; Nozoye, H. J. Phys. Chem. B 1999, 103, 2585.
39. Nambu, A.; Kondoh, H.; Ehara, Y.; Yokoyama, T.; Ohta, T., manuscript in preparation.
40. Baumgartner, K.M.; Volmer-Uebing, M.; Taborski, J.; Bauerle, P.; Umbach, E. Ber. Bunsen-Ges. Phys. Chem. 1991, 95, 1488.
41. Ocko, B.M.; Wu, X.Z.; Sirota, E.B.; Sinha, S.K.; Gang, O.; Deutsch, M. Phys. Rev. E 1997, 55, 3164.
42. The interface energy for disordered monolayers cannot be determined unless the degree of disordering is defined. From the NEXAFS spectra, however, the "disordered" phase shows complete disordering. Therefore, the interface energies for liquid are used to stand for the disordered phaseS. This substitution would not cause a significant effect on the estimated interface energy difference if we properly consider the temperature dependence of the interface energies of liquid.
43. Jasper, J.J. J. Phys. Chem. Ref. Data 1972, 1, 841.
44. CH3, respectively.
45. Fox, H.W.; Zisman, W.A. J. Coll. Sci. 1952, 7, 428.
46. 2.