Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

Electronics Letters

Volumn 37, Issue 22, 2001, Pages 1335-1336

  Sandhu, A ^a   Masuda, H ^b   Kurosawa, K ^c   Oral, A ^d   Bending, S J ^e  

^a TOKAI UNIVERSITY   (Japan)

^b Toei Kogyo Ltd   (Japan)

^c HITACHI LTD   (Japan)

^d BILKENT UNIVERSITY   (Turkey)

^e University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; FERROMAGNETISM; GARNETS; ION BEAMS; MAGNETIC DOMAINS; MAGNETIC RESONANCE IMAGING; MAGNETIZATION; NANOTECHNOLOGY; PERMANENT MAGNETS; PHOTORESISTS; PROBES; SCANNING ELECTRON MICROSCOPY;

FOCUSED ION BEAMS (FIB);

HALL EFFECT DEVICES;

EID: 0035950076     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20010908     Document Type: Article

References (6)

1. Scanning Hall probe microscopy
2. Scanning Hall probe microscopy of superconductors and magnetic materials
3. Spontaneous bubble domain formation in a layered ferromagnetic crystal
4. Room temperature sub-micron magnetic imaging by scanning Hall probe microscopy
5. Magnetic noise measurements using cross-correlated Hall sensor arrays
6. Direct magnetic imaging of ferromagnetic domain structures by room temperature scanning Hall probe microscopy using a Bismuth micro-Hall probe