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Volumn 79, Issue 13, 2001, Pages 1998-2000

Composition, atomic transport, and chemical stability of ZrAlxOy ultrathin films deposited on Si(001)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035943816     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1405808     Document Type: Article
Times cited : (11)

References (18)
  • 17
    • 0003874318 scopus 로고
    • edited by J. M. Walls Cambridge University Press, Cambridge, U.K.
    • D. G. Armour, in Methods of Surface Analysis, edited by J. M. Walls (Cambridge University Press, Cambridge, U.K., 1989).
    • (1989) Methods of Surface Analysis
    • Armour, D.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.