Stoichiometry-induced roughness on antimonide growth surfaces

Applied Physics Letters

Volumn 78, Issue 17, 2001, Pages 2440-

  Bracker, A S ^a   Nosho, B Z ^a   Barvosa Carter, W ^a   Whitman, L J ^a   Bennett, B R ^a   Shanabrook, B V ^a   Culbertson, J C ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

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EID: 0035938306     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1366360     Document Type: Article

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