Scanning tunneling microscopy of endohedral metallofullerene Tb@C82 on C60 film and Si(100) 2 × 1 surface

Journal of Physical Chemistry B

Volumn 105, Issue 46, 2001, Pages 11414-11418

  Shi, Bo Rong ^a,b   Wang, Xue Sen ^a   Huang, Houjin ^a   Yang, Shi He ^a   Heiland, Wener ^c   Cue, Nelson ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b SHANDONG UNIVERSITY   (China)

^c UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METALLOFULLERENE;

CONDUCTIVE FILMS; DEPOSITION; DIMERS; GRAPHITE; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE PROPERTIES; TERBIUM;

FULLERENES;

EID: 0035936222     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0117112     Document Type: Article

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