SCOPUS 정보 검색 플랫폼

Volumn 49, Issue 11, 2001, Pages 2109-2113

Determination of amorphous interfacial phases in Al2O3/SiC nanocomposites by computer-aided high-resolution electron microscopy

(4) Ferroni, L P a Pezzotti, G a Isshiki, T a Kleebe, H J b

a KYOTO INSTITUTE OF TECHNOLOGY (Japan)

b UNIVERSITY OF BAYREUTH (Germany)

Author keywords

Composites; Electron diffraction; Grain boundaries; Image analysis

Indexed keywords

ALUMINA; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

COMPUTER AIDED HIGH RESOLUTION ELECTRON MICROSCOPY;

AMORPHOUS FILMS;

EID: 0035933657 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(01)00117-3 Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.