Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue , 2001, Pages 275-278

  Keil, P ^a   Lutzenkirchen Hecht D ^a   Novikov, D V ^b   Hahn, U ^b   Frahm, R ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b DESY   (Germany)

Author keywords

Diffuse scattering; GIXS; X ray mirror; X ray reflectivity; X ray scattering

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT REFLECTION; SYNCHROTRON RADIATION; X RAY SCATTERING;

DIFFUSE SCATTERING;

MIRRORS;

EID: 0035928198     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00304-7     Document Type: Conference Paper

References (11)