Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods

Materials Science and Engineering: B

Volumn 83, Issue 1-3, 2001, Pages 173-179

  Ayoub, M ^a   Hage Ali, M ^a   Koebel, J M ^a   Regal, R ^a   Rit, C ^a   Klotz, F ^a   Zumbiehli, A ^a   Siffert, P ^a  

^a Phase CNRS   (France)

Author keywords

CdTe; Concentration; Defects; PICTS; SCLC

Indexed keywords

ABSORPTION SPECTROSCOPY; DEFECTS; ELECTRIC CURRENTS; ELECTRIC SPACE CHARGE; LIGHT ABSORPTION; PARTICLE DETECTORS; PHOTONS;

PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS); SPACE CHARGE LIMITED CURRENTS (SCLC);

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0035927953     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)00513-X     Document Type: Article

References (10)