SCOPUS 정보 검색 플랫폼

Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

X-ray reflectivity from self-assembled structures in Ge/Si superlattices

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; REFLECTION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SUBSTRATES;

GRAZING INCIDENCE; X-RAY REFLECTIVITY;

SEMICONDUCTOR SUPERLATTICES;

EID: 0035926710 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/10a/340 Document Type: Article

Times cited : (4)

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