X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires

Journal of Physics D: Applied Physics

Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

  Ulyanenkov, A ^a   Inaba, K ^a   Mikulik P ^b   Darowski, N ^c   Omote, K ^a   Pietsch, U ^c   Grenzer, J ^c   Forchel, A ^d  

^a RIGAKU CORPORATION   (Japan)

^b MASARYK UNIVERSITY   (Czech Republic)

^c UNIVERSITY OF POTSDAM   (Germany)

^d UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; COMPUTER SIMULATION; FINITE ELEMENT METHOD; REFLECTION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; X RAY DIFFRACTION ANALYSIS; X RAY TUBES;

ATOMIC DISPLACEMENTS;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0035926601     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/10a/337     Document Type: Article

References (8)

1. Mikulík P and Baumbach T 1999 Phys. Rev. B 59 7632
2. Ulyanenkov A, Baumbach T, Darowski N, Pietsch U, Wang K, Forchel A and Wiebach T 1999 J. Appl. Phys. 85 1524
3. Ulyanenkov A, Darowski N, Grenzer J, Pietsch U, Wang K and Forchel A 1999 Phys. Rev. B 60 16701
4. Maystre D 1984 Progress in Optics XXI ed E Wolf (Amsterdam: North-Holland)
5. Tolan M, Press W, Brinkop F and Kotthaus J 1995 Phys. Rev. B 51 2239
6. Nevière M 1994 J. Opt. Soc. Am. A 11 1835
7. Mikulík P 1997 X-ray reflectivity from planar and structured multilayers PhD Thesis Université Joseph Fourier (Grenoble) and Masaryk University (Brno) web page http://www.sci.muni.cz/∼mikulik/Thesis/
8. Baumbach T and Mikulík P 1999 X-Ray and Neutron Reflectivity: Principles and Applications ed J Daillant and A Gibaud (Berlin: Springer) p 232