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Volumn 464, Issue 1-3, 2001, Pages 315-320

Possible impact of multi-electron loss events on the average beam charge state in an HIF target chamber and a neutral beam approach

Author keywords

Heavy ion driver beam; Multi electron loss events; Neutral beam

Indexed keywords

HEAVY IONS; ION BEAMS; IONIZATION; TARGETS;

EID: 0035926454     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00054-7     Document Type: Conference Paper
Times cited : (22)

References (11)
  • 11
    • 0004735446 scopus 로고    scopus 로고
    • private communication
    • (2000)
    • Lee, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.