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Volumn 462, Issue 3, 2001, Pages 568-575

Diffraction and depths-of-field effects in electron beam imaging at SURF III

Author keywords

Depth of field; Diffraction; Electron beam diagnostics; Storage ring; Synchrotron radiation; Transverse beam size

Indexed keywords

ELECTRON BEAMS; ELECTRON DIFFRACTION; IMAGING TECHNIQUES; SYNCHROTRON RADIATION;

EID: 0035925954     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)01328-0     Document Type: Article
Times cited : (10)

References (13)
  • 3
    • 0343442127 scopus 로고    scopus 로고
    • Beam Diagnostics and Applications
    • in; R.O. Hefferl, S.R. Smith, J.D. Masek (Eds.), Beam Instrumentation Workshop, AIP, Woodbury, New York
    • A. Hofmann, Beam Diagnostics and Applications, in; R.O. Hefferl, S.R. Smith, J.D. Masek (Eds.), Beam Instrumentation Workshop, AIP Conf. Proc., AIP, Woodbury, New York, 1998.
    • (1998) AIP Conf. Proc.
    • Hofmann, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.