|
|
Volumn 194, Issue 1-3, 2001, Pages 249-261
|
|
Semi-quantitative analysis of changes in soil coatings by scanning electron microscope and energy dispersive X-ray mapping
|
|
Author keywords
Elemental mapping; Energy dispersive X ray; Scanning electron microscope; Soil aquifer treatment; Soil surface coatings
|
|
Indexed keywords
CHEMICAL ANALYSIS;
ENERGY DISPERSIVE SPECTROSCOPY;
IMAGE PROCESSING;
SCANNING ELECTRON MICROSCOPY;
SEDIMENTS;
SILICA;
SOIL MECHANICS;
SOIL TESTING;
X RAY SPECTROSCOPY;
SOIL COATINGS;
ORGANIC COATINGS;
ELEMENT;
SILICON DIOXIDE;
ARTICLE;
ELECTRON MICROSCOPE;
IMAGE ANALYSIS;
PRIORITY JOURNAL;
ROENTGEN SPECTROSCOPY;
SAMPLE;
SCANNING ELECTRON MICROSCOPY;
SOIL POLLUTION;
SURFACE PROPERTY;
TECHNIQUE;
|
|
EID: 0035924039
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-7757(01)00814-7 Document Type: Article |
|
Times cited : (6)
|
|
References (9)
|
