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Volumn 489, Issue 1-3, 2001, Pages 161-168
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Stranski-Krastanov growth of Sn on a polycrystalline Al film surface initiated by the wetting of Al by Sn
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Author keywords
Aluminum; Atomic force microscopy; Auger electron spectroscopy; Polycrystalline thin films; Sputtering; Tin; Wetting
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Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
FILM GROWTH;
POLYCRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SPUTTER DEPOSITION;
SURFACE CLEANING;
SURFACE TREATMENT;
TIN;
WETTING;
POLYCRYSTALLINE THIN FILMS;
THIN FILMS;
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EID: 0035921006
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01174-8 Document Type: Article |
Times cited : (26)
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References (21)
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