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Volumn 489, Issue 1-3, 2001, Pages 161-168

Stranski-Krastanov growth of Sn on a polycrystalline Al film surface initiated by the wetting of Al by Sn

Author keywords

Aluminum; Atomic force microscopy; Auger electron spectroscopy; Polycrystalline thin films; Sputtering; Tin; Wetting

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; FILM GROWTH; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; SURFACE CLEANING; SURFACE TREATMENT; TIN; WETTING;

EID: 0035921006     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01174-8     Document Type: Article
Times cited : (26)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.