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Volumn 84, Issue 3, 2001, Pages 189-194
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Deformational twinning in CdTe crystals grown by the Bridgman method
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Author keywords
CdTe; Crystal growth; Deformational twinning; Structural defects; X ray diffraction; rays counting
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL GROWTH FROM MELT;
GAMMA RAY SPECTROMETERS;
HEAT RESISTANCE;
STOICHIOMETRY;
THERMAL STRESS;
TWINNING;
X RAY DIFFRACTION ANALYSIS;
DEFORMATIONAL TWINNING;
GAMMA RAYS COUNTRING;
SEMICONDUCTING CADMIUM TELLURIDE;
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EID: 0035920013
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(01)00556-6 Document Type: Article |
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Times cited : (3)
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References (12)
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